SCR ELEKTRONIKS Impulse Voltage Testers and Surge Current Testers are designed for interference test as per IEC 61180. Impulse Voltage Testers produce a Voltage Impulse of the required 1.2 / 50 microsecond waveform, meaning a high voltage pulse with 1.2 microseconds rise time and 50 microseconds fall time. The voltage level is settable from 0.5kV to 25kV (depending upon model). Likewise, the Surge Testers will produce a current surge with the required wave-shape of 8 / 20 microsecond, meaning a high current surge with 8 microseconds rise time and 20 microseconds fall time.
Influence of Supply Voltage Test Equipment ‘ISVT 01’ is used to measure and analyze the influence of supply voltage on energy meter. This test is described in various standards for energy meters such as IS 13779, IEC 62053 etc.As per CEI / IEC 62053-21, IS 13779 clause 12.7.2: The test shall be carried out under the following conditions: 1. Meter in operating condition. 2. Voltage and auxiliary circuits energized with reference voltage. 3. Without any current in the current circuits.
The SCR Elektroniks Endurance Test Bench is designed for electrical and mechanical endurance MCB and RCCB as per clause 9.11 of IEC 60898-1. The source and the load is designed to comply as per the general test conditions specified in Cl 9.11.1. The accompanying pneumatic fixture is designed to hold custom built designs of MCB and RCCB while the microcontroller based timer unit can be configure to follow test procedure summarized in Cl 9.11.2.
The SCR Elektroniks MCB Instantaneous Trip Test Bench is designed for Testing of MCB to carry out “Test of Instantaneous Tripping and of correct opening of the Contacts” as per IEC: 60898-1:2002 Clause 9.10.2 at rated voltage. This test is carried out with power factor between 0.95 and 1 with the sequence operation being O-t-CO-t-CO-t-CO with timings as specified in 9.12.11.1.
The SCR Elektroniks 3 station MCB Temperature Rise and Power Loss Test Bench is economically designed to verify temperature rise and measure power loss as per clause 9.8 of IEC 60898 with the circuit designed to follow test procedure as per Cl 9.8.2. The temperature rise is measured in accordance with Cl 9.8.3 and 9.8.4 while power loss is measured and verified as per Table 15 of Cl 9.8.5.
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